Abstract
The preparation of solid samples of alloys suitable for optical transmission and electrical measurements is considered. Cross sectional slices of ingots produced by slow directional freezing and slow zone recrystallization have been investigated by x‐ray powder photograph techniques, and results are given for the variation of composition with position along ingot and for homogeneity of the slice. Annealed powder samples have been used to check the previous data for the variation of lattice parameter with composition. Specimens have also been observed by photomicrograph methods and by use of an electron probe microanalyzer. The x‐ray, photomicrograph, and microanalyzer data are compared for various samples with different degrees of homogeneity.
Published Version
Talk to us
Join us for a 30 min session where you can share your feedback and ask us any queries you have
Schedule a call