Abstract

AbstractThe Bi2O3 thin films were prepared onto glass substrates by spray pyrolysis method. The Bi2O3 thin films optimized at 320 °C spray pyrolysis temperature. The crystal structure, crystallite size, and surface morphology of Bi2O3 thin films were studied by X‐ray diffraction (XRD) and scanning electron microscopy (SEM) techniques, respectively. The X‐ray diffraction pattern of Bi2O3 thin films show polycrystalline in nature. The SEM images show porous morphology of Bi2O3 thin films. The optical absorption spectra of films were examined in order to study their band gap energy. The optical study shows a direct band gap of 2.90 eV for Bi2O3 films.

Talk to us

Join us for a 30 min session where you can share your feedback and ask us any queries you have

Schedule a call

Disclaimer: All third-party content on this website/platform is and will remain the property of their respective owners and is provided on "as is" basis without any warranties, express or implied. Use of third-party content does not indicate any affiliation, sponsorship with or endorsement by them. Any references to third-party content is to identify the corresponding services and shall be considered fair use under The CopyrightLaw.