Abstract
Lu2O3:Eu scintillation film is one of the most attractive candidate for the hard X-ray imaging, especially for sub-micrometer spatial resolution X-ray detectors. This study was focused on the preparation and characterization of Lu2O3:Eu structured scintillation film on (001) sapphire substrate by laser chemical vapor deposition (LCVD). The grazing incidence X-ray diffraction (GIXRD) measurement shows that the film with thicknesses of 3 μm is oriented along the (411) direction. The morphology and luminescent properties, including photoluminescence excitation (PLE), photoluminescence (PL) and PL decay, were measured and discussed. The sub-micrometer spatial resolution was obtained at BL13W1 station at Shanghai synchrotron radiation facility (SSRF).
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