Abstract
CaCu3Ti4O12 (CCTO) ceramic thick films have been prepared on Copper substrate, using ceramic powders by an aerosol deposition method (ADM). The ceramic powders are prepared by traditional solid state reaction processing at 1100 oC for 5 h. X-ray diffraction and scanning electron microscopy are used to investigate the microstructure and the phase composition of the deposited films. The results indicate that thick films are pure CCTO phase and homogenous. The dielectric impedance spectra indicate that the dielectric constant of CCTO thick film can reach 3×103.
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