Abstract
Polycrystalline thin films of CdxHg1−xTe (0.958<x<0.997) were obtained by deposition of HgTe on pre-deposited CdTe thin films used as substrates by close spaced sublimation (CSS) technique. The cadmium mercury telluride (CMT) thin film samples characterized by different techniques showed a decreasing trend of band gap from 1.48 to 1.43 eV with the increase of Hg concentration. The deposited samples showed high value of resistivity. The prepared samples were infrared sensitive in the 800–900 nm wavelength range.
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