Abstract
Zinc oxide thin films are widely investigated for optoelectronic and solar cell applications, due to its tunable physical properties. ZnO thin films were prepared by nebulized spray pyrolysis method using dry zinc chloride as the precursor of zinc by varying the substrate temperature and the precursor concentration. The samples were characterized through X-ray diffraction analysis, field emission scanning electron microscopy, UV-Vis-NIR Spectrophotometry, electrical measurement, to study the structural, surface morphological, optical and electrical properties of the prepared zinc oxide thin films. The results of the analyzes confirm that the films are highly crystalline in nature having preferred orientation along (002) plane. The optoelectronic analyzes show that the films are highly transparent having the resistivity in the range of insulators, which further confirms that the films can be used as the buffer layers in the thin films solar cells.
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