Abstract
Natural-superlattice-structured ferroelectric thin films, Bi3TiNbO9–Bi4Ti3O12 (BTN–BIT), have been grown on Pt/TiO2/SiO2/Si and SrTiO3(001) single-crystal substrates by pulsed-laser deposition (PLD) using BTN–BIT (1 mol:1 mol) targets. BTN–BIT films show natural-superlattice peaks below 2θ=16° in x-ray diffraction patterns only when using an oxygen pressure of 0.05–0.07 Torr in the deposition. The c-axis lattice constant (8.300 nm) of BTN–BIT films suggests a natural superlattice structure consisting of iteration of two unit cells of Bi3TiNbO9 and one unit cell of Bi4Ti3O12. This 2–1 superlattice structure is different from that of BTN–BIT ceramics (2.909 nm), which is 1–1 superlattice. Natural-superlattice-structured BTN–BIT thin films having the 2–1 superlattice prepared at 550 °C exhibit superior ferroelectricity reflected by the value of 2Pr, which is 50 μC/cm2.
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