Abstract
The present paper suggests an approach to estimating and predicting the serviceability of on-board electronic equipment. It is based on the postulates of the reliability theory and accounts for total-dose and single-event radiation effects as well as other exterior destabilizing factors. The methods of determination of failure and upset rates for CMOS devices are considered. The probability of non-failure operation of a two CMOS RAM is calculated along the whole trajectory of the “Solar Probe” spacecraft.
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