Abstract

Fretting fatigue is a critical load that appears on many structures, such as the blade/disk contact of aircraft engines, train wheel assemblies, etc. Predicting crack nucleation risk is essential for safety, but is particularly complex. Fretting contact stress is multiaxial, with severe stress gradients. To palliate this difficulty, a common approach consists in computing multiaxial fatigue at a critical distance, thus correcting the stress gradient effect and achieving stable pertinent predictions. However, this strategy is very costly in FEM computation due to very fine FEM mesh size, which may be <10μm, and application needs to be limited in large 3D industrial contacts. Investigating the partial slip fretting crack nucleation boundaries of 35NCD16 steel (plane) fretted against 52100 steel cylinders, a new semi-empirical contact loading parameter was introduced, defined as the maximum shear stress generated in the interface (qmax) multiplied by the square-root of the sliding size (s) of the partial slip interface (i.e., ϕ = qmax ×√s). Using this very simple parameter inspired by “crack analog strategy”, it was found that all the crack nucleation data obtained for a wide spectrum of contact pressures and cylinder radii were aligned along a single master curve. Scatter was very low, even less than for the costly “fatigue-critical distance method”. The approach was extended to various fretting-fatigue loading conditions, confirming stability of prediction.

Talk to us

Join us for a 30 min session where you can share your feedback and ask us any queries you have

Schedule a call

Disclaimer: All third-party content on this website/platform is and will remain the property of their respective owners and is provided on "as is" basis without any warranties, express or implied. Use of third-party content does not indicate any affiliation, sponsorship with or endorsement by them. Any references to third-party content is to identify the corresponding services and shall be considered fair use under The CopyrightLaw.