Predicting random jitter - Exploring the current simulation techniques for predicting the noise in oscillator, clock, and timing circuits

Abstract

The random jitter performance of clock, oscillator, and timing circuits can be predicted by using steady-state circuit simulation techniques that determine phase noise by analyzing the impact on phase due to thermal, flicker, channel, and shot noise present in the electronic devices. Given the phase noise response, and the steady-state operating conditions of the circuit, a wide variety of jitter measurements can be computed. Each involves a transformation of the phase noise results, with accuracy hinging on the quality of the phase noise response over a suitable range of offset frequencies