Abstract
A four-level N-type atom–field system exhibiting the Raman gain process is revisited for precision in position information of a single atom in a two-dimensional (2D) xy-plane. The atom interacts with two standing-wave fields where each standing-wave field is obtained via superposition of two orthogonal standing-wave fields, i.e., along the x and y directions, whereas a probe field is applied to observe the Raman gain process. The role of probe field detuning and phase shifts associated with the standing-wave fields in precision position information of a single atom in a 2D plane is investigated. The suggested scheme leads to enhancement in the spatial resolution in measuring the position of the atom, and a single atom localization peak in the xy-plane having a spatial resolution of the order of λ/10 is noticed.
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