Abstract
In order to overcome the various effects detrimental to precision and accuracy, such as compositional, lithological, mineralogical and granulometric variations, fusions, tedious mathematical corrections, thin film techniques and separate calibrations for each matrix type are employed in x-ray fluorescence (XRF) spectrometric analysis of major and minor components in silicate rocks. It is generally accepted that only by using such measures can quantative analytical data be obtained. However, the above mentioned procedures may not always be suitable for trace element analysis, since dilutions decrease the signals, giving poor detections. Consequently, there are numerous reports giving details of powder procedures for determining minor and trace elements in silicates.
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