Abstract
A method is developed for precise determination of the unit cell parameters of single crystals. At room temperature zero-layer X-ray rotation patterns taken in asymmetric position and indexed by means of corresponding Weissenberg patterns are used. At high temperatures a technique is applied, in which a thermocouple mounted on the goniometer head in a Weissenberg camera serves to support and heat the crystal. Diffraction spots at highest Bragg angles are considered applying adequate procedures for minimization of systematic errors in spot positions. [Russian Text Ignored]
Sign-in/Register to access full text options 
Talk to us
Join us for a 30 min session where you can share your feedback and ask us any queries you have
Schedule a callDisclaimer: All third-party content on this website/platform is and will remain the property of their respective owners and is provided on "as is" basis without any warranties, express or implied. Use of third-party content does not indicate any affiliation, sponsorship with or endorsement by them. Any references to third-party content is to identify the corresponding services and shall be considered fair use under The CopyrightLaw.
