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https://doi.org/10.1088/1742-6596/194/6/062018
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Cite Publication Date: Nov 1, 2009 | |
 License type: cc-iop-open |
Dielectronic resonance energies were measured for high charge states of Xe using the Shanghai Electron Beam Ion Trap equipped with a high precision voltage divider. Fifteen experimental resonant energies were obtained at an average uncertainty level of 0.03%.
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