Abstract
Higher manganese silicides (HMSs) exhibit interesting thermoelectric and optoelectronic properties. Development of HMS-based thermoelements and microthermopiles of different designs may meet a number of problems, which can be solved only when the real structure of crystals and thin layers on which they are based is established. We have applied scanning and transmission electron microscopy and electron diffraction to investigate HMS crystals of two types: single crystals grown from melt by the Bridgman method and microislands formed by reactive diffusion during manganese vapor deposition on silicon substrates. The exact phase composition of these materials is established: matrix HMS crystal belonging to tetragonal system (Mn4Si7 composition) and precipitates of cubic manganese monosilicide MnSi. The shape and sizes of precipitates are determined, the crystallographic relationships between the tetragonal and cubic phases are found, and the interface is investigated.
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