Abstract
The curvature relaxation technique is a new electrode-free method for simultaneously measuring a material’s chemical oxygen surface exchange coefficient and stress state under controlled atmosphere and temperature conditions. Provided certain conditions are met, this in situ/in operando technique can be used to accurately measure the oxygen surface exchange coefficients and stress states of dense, porous, thin, or thick film oxygen exchange materials. The present paper provides a detailed, practical discussion of these conditions and compares the curvature relaxation technique to alternative oxygen surface exchange coefficient measurement approaches.
Sign-in/Register to access full text options 
Talk to us
Join us for a 30 min session where you can share your feedback and ask us any queries you have
Schedule a callDisclaimer: All third-party content on this website/platform is and will remain the property of their respective owners and is provided on "as is" basis without any warranties, express or implied. Use of third-party content does not indicate any affiliation, sponsorship with or endorsement by them. Any references to third-party content is to identify the corresponding services and shall be considered fair use under The CopyrightLaw.
