Abstract
The curvature relaxation technique is a new electrode-free method for simultaneously measuring a material’s chemical oxygen surface exchange coefficient and stress state under controlled atmosphere and temperature conditions. Provided certain conditions are met, this in situ/in operando technique can be used to accurately measure the oxygen surface exchange coefficients and stress states of dense, porous, thin, or thick film oxygen exchange materials. The present paper provides a detailed, practical discussion of these conditions and compares the curvature relaxation technique to alternative oxygen surface exchange coefficient measurement approaches.
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