Abstract
An ADC-based current-mode sense amplifier and its usage to improve speed, power efficiency, and reliability of ReRAM are proposed. The adaptive step-size control of incremental step pulse programming enables 2.25 times faster write with 50% power. The degradation of ReRAM cells due to aging can be recovered by hidden refresh without sacrificing system performance. The test circuits are fabricated using a 350-nm technology and integrated with a 1-Kb HfOx array chip.
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Schedule a callMore From: IEEE Transactions on Circuits and Systems II: Analog and Digital Signal Processing
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