Abstract
We are developing a defect analysis capability based on two positron beam lifetime spectrometers: the first is based on a 3 MeV electrostatic accelerator and the second on our high current linac beam. The high energy beam lifetime spectrometer is operational and positron lifetime analysis is performed with a 3 MeV positron beam on thick sample specimens. It is being used for bulk sample analysis and analysis of samples encapsulated in controlled environments for in situ measurements. A second, low energy, microscopically focused, pulsed positron beam for defect analysis by positron lifetime spectroscopy is under development at the LLNL high current positron source. This beam will enable defect-specific, 3-dimensional maps of defect concentration with sub-micron location resolution. When coupled with first principles calculations of defect specific positron lifetimes it will enable new levels of defect concentration mapping and defect identification.
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