Abstract
Results of positron annihilation spectroscopy studies of pure gold samples irradiated with various doses of Xe26+ have been reported. The conventional positron lifetime measurements and positron beam tests were performed. Increase of positron lifetime in irradiated samples up to ca. 170 ps is interpreted as the existence of stacking fault tetrahedras in all studied samples. The damaged zone determined in etching experiment equals 9 μm and it is in a good agreement with theoretical results. The long range effect was not found. The positron beam studies provide information about the increase of defect concentration with the growing number of displacements per atom achieved during irradiation.
Published Version
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