Abstract
An initial state effect is established as origin for the positive 2p core electron binding energy shift found for CuN-clusters supported by a thin silica layer of a p-doped Si(100) wafer. Using the concept of the Auger parameter and taking into account the usually neglected Coulomb correlation shift in the Auger final state (M4,5M4,5) it is shown that the initial state shift is comparable to the measured XPS shift while the final state relaxation shift contributes only marginally to the binding energy shift. The cluster results differ from the negative surface core-level shift of crystalline copper which has been explained in terms of a final state relaxation effect.
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