Abstract
The scanning photoelectron microscope (SPEM) on beam line 2.2 at the Elettra synchrotron produces small spot XPS spectra from a sub-micron radiation microprobe. It is also capable of producing surface images in terms of the energy resolved photoelectron signal. This microscope has been used to study oxidation on polycrystalline tin and lead surfaces and the variations in reactivity between different crystallite surfaces. The diffusion of gold and silver films on polycrystalline metal surfaces has also been followed.
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