Abstract
The ferroelectric domain structures of tetragonal lead zirconate titanate (PZT) ceramics were evaluated by investigating the poling field (E) dependence of the planar coupling factor (k p) and the relative intensity of X-ray diffraction (002) peak, I002. Fifteen typical domain configurations were proposed. Furthermore, we selected the two patterns which make a domain configuration model with 90° and 180° domains. It was thought that the change in domain structure due to poling could be explained by calculating the change in area of domain for each axis. Therefore, the total number of domains oriented along the c axis was estimated from using the relationship between I002, k p, the normalized polarization and E. Using our domain configuration model, it was confirmed that there were two peaks corresponding to 90° domain rotation and one peak corresponding to 180° domain switching. After the 90° domain rotation occurred, the domains along the c axis were changed mainly by 180° switching. As a result, the degree of 90° domain rotation decreased and that of 180° domain switching increased. Our study on domain structures in bulk ceramics is useful for understanding the degradation characteristics of PZT thin films.
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