Abstract
The work is devoted to study of polarization photosensitivity of structure on the basis of ZnSe single crystals. To produce such photosensitive structure we used heat treatment of ZnSe substrates on dry air. The polarization photosensitivity was detected and studied in relation to their manufacturing conditions and photoregistration configuration. We conclude that such photosensitive structure can be used as polarimetric short wavelength photodetector.
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