Abstract

Modern observatories and instruments require optics fabricated at larger sizes with more stringent performance requirements. The Daniel K. Inouye Solar Telescope (DKIST) will be the world’s largest solar telescope at 4.0-m aperture delivering a 300 W beam and a 5 arc min field. Spatial variation of retardance is a limitation to calibration of the full field. Three polarimeters operate seven cameras simultaneously in narrow bandpasses from 380 to 1800 nm. The DKIST polarization calibration optics must be 120 mm in diameter at Gregorian focus to pass the beam and operate under high heat load, UV flux, and environmental variability. Similar constraints apply to the three retarders for modulation within the instrument suite with large beams near focal planes at F/18 to F/62. We assess how design factors can produce more spatial and spectral errors simulating elliptical retardance caused by polishing errors. We measure over 5-deg net circular retardance and spectral oscillations over ±2 deg for optics specified as strictly linear retarders. Spatial variations on scales >10 mm contain 90% of the variation. Different designs can be a factor of 2 more sensitive to polishing errors with dissimilar spatial distributions even when using identical retardance bias values and materials. The calibration of the on axis beam is not impacted once circular retardance is included. The calibration of the full field is limited by spatial retardance variation unless techniques account for this variation. We show calibration retarder variation at amplitudes of 1-deg retardance for field angles greater than roughly 1 arc min for both quartz and MgF2 retarders at visible wavelengths with significant variation between the three DKIST calibration retarders. We present polishing error maps to inform calibration techniques attempting to deliver absolute accuracy of system calibration below effective cross talk levels of 1 deg retardance.

Highlights

  • We showed in this paper how the field of view available for calibration at the high accuracy for Daniel K. Inouye Solar Telescope (DKIST) is impacted by of spatial nonuniformity for our six-crystal super achromatic calibration retarders

  • Wide wavelength requirements and high heat loads can drive designs to large apertures and manycrystal polychromatic solutions mounted near focal planes that create elliptical retardance and couples in spatial variation to calibration accuracy

  • Spectral metrology tools showed that net circular retardance over 5 deg and spectral oscillations of circular retardance of over Æ2 deg were detected in the DKIST calibration retarders

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Summary

Introduction

Later designs for superachromats used three compounds or bicrystalline achromats in place of A and B for six total crystals.[7] This increased the wavelength range when requiring achromatic linear retardance of various specifications to achieve high efficiency of modulation or calibration. The longer wavelength designs used MgF2 crystals around 2-mm physical thickness, giving 40-waves net retardance bias at 633 nm for this higher birefringence material Another first light instrument was designed to include infrared capabilities at wavelengths as long as 5000 nm. The optics we designate for the DL-NIRSP has a wavelength range for reasonably efficient modulation from 500 to 2500 nm with the calibration retarder covering from 900 to 2500 nm. We show retardance spatial nonuniformity of polycarbonate and ferroelectric liquidcrystal-type retarders

Validation of Fabricated Six-Crystal Calibration Retarders
Physical Thickness and Individual Crystal Measurements at Meadowlark Optics
Meadowlark Optics Compound Retarder Metrology at Five Aperture Locations
Mueller Matrix Measurements with NSO Lab Spectropolarimeter
Polishing Errors and Spatial Uniformity of Retarders
Mapping Retardance Uniformity across the MgF 2 Two-Crystal Achromats
Sensitivity to Error Spatial Distributions
Spatial Measurements of As-Built Six-Crystal Retarders
Impact to DKIST Calibration
Impact to Instruments
Comparison of Uniformity Impacts with Continuously Rotating Modulators
Summary
Limiting Cases
Degenerate Solutions
Euler Angles as an Equivalent Rotation Formalism
10 Appendix B
10.1 Spatial Retardance Variation for a MgF 2 Retarder
10.2 Measuring a MgF 2 Elliptical Retarder
10.3 Measuring a SiO2 Elliptical Retarder
10.4 Measuring another SiO2 Elliptical Retarder
10.5 Measuring the DL-NIRSP SiO2 Calibration Retarder
11 Appendix C
11.1 Polycarbonate Spatial Uniformity and Use with Ferro-Electric Liquid Crystals
11.2 Ferro-Electric Liquid-Crystal Spatial Uniformity With Wavelength
Findings
11.3 Polycarbonate Five Layer Superachromatic Retarder Spatial Uniformity
Full Text
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