Abstract
The back-illuminated separate absorption and multiplication AlGaN avalanche photodiodes (APDs) with a p-type graded AlGaN layer have been designed to investigate the polarization engineering on the performance of the devices. The calculated results show that the APD with p-graded AlGaN layer exhibits lower avalanche breakdown voltage and increased maximum multiplication gain compared to the structure with conventional p-type AlGaN layer. The improved performance of the designed APD is numerically explained by the polarization-assisted enhancement of the ionization electric field in the multiplication region and polarization doping effect caused by the p-type graded layer.
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