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https://doi.org/10.1016/0167-2738(85)90104-3
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Cite Journal: Solid State Ionics |  Publication Date: Feb 1, 1985 |
 Citations: 6 |
Affiliation: University of Southern California
A new derivation is presented for the dependence on the charge of mobile ionic species of the ratio between EMF differences measuring oxygen activity in a semiconducting oxide and an applied voltage driving an electronic current. The theory includes cases in which majority defects and the most mobile ionic defects are not the same.
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