Abstract
AbstractThis paper is focused on the use of the Polarization‐Modulation Infrared Reflection‐Absorption Spectroscopy (PM‐IRRAS) for studying thin polymer films at interfaces. When forming a polymer film on a metallic substrate, for instance by spin‐coating, the characterization of the polymeric layer becomes very difficult given the small amount of matter deposited and also because of the contact with the metal. Among the techniques well adapted to surface and interface analyses, the PM‐IRRAS spectroscopy represents an excellent tool to probe ultra‐thin films.Different systems have been selected in this study such as polyamides (PA) and ethylene‐co‐vinyl acetate (EVA) nanofilms spin‐coated onto chemically controlled surfaces (i.e. thiol self‐assembled monloayers grafted onto gold coated glass slides). PM‐IRRAS spectroscopy allowed us to characterize the polymer anisotropy (chains orientation and conformation), to suggest a model for chain organization at the polymer/substrate interface, and to calculate the orientation angles. Moreover, we were able to determine, by using PM‐IRRAS, the degree of crystallinity of PA and EVA films of nanometric dimensions without any calibration procedure needed by other techniques.
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