Abstract
Zinc oxide (ZnO) film deposition has been carried out by plasma-assisted mist chemical vapor deposition (CVD) using a solution of zinc acetate [Zn(CH3COO)2], and the effects of plasma exposure on film properties have been investigated in terms of RF power. With increasing RF power, the results of the X-ray diffraction (XRD) patterns of ZnO films with plasma exposure showed the existence of crystallized ZnO films with plasma exposure. Under this condition, the substrate temperature was as low as 200 °C for a plasma exposure time of 20 min. The surface morphology shown by scanning electron microscopy (SEM) images shows that the ZnO films were textured with round grains, which is attributed to the effect of the use of mist with the precursor.
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