Abstract
Planar tunneling spectroscopy is used to probe the near-surface density of states of YBCO thin films. A gentle solution-growth insulator deposition technique allows us to detect (1) the ZBCP up to the bulk T c of the film; (2) new features and (3) orientation dependence of the gap-like feature. We propose that a narrow tunneling cone and reduced surface disorder contribute to our results.
Published Version
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