Abstract
We demonstrate a series of procedures to prepare a clean surface of micro-sized graphite, mined from a bulk flake and securely affixed onto a macroscopic Si plate by focused ion beam scanning electron microscope. Analyses of structure and electronic (chemical) states were made using micro-beam X-ray photoelectron spectroscopy and angle-resolved photoemission spectroscopy. At the surface of the micro graphite, the band dispersion from a single-domain structure was observed. The proposed methodology showcases its capability to produce clean and high-quality micro samples suitable for surface-sensitive analyses. This technique paves the way to investigate surfaces of unexplored microcrystals embedded in complex materials.
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