Abstract
Thickness dependence of the dielectric and piezoelectric properties of (1-x)Pb(Mg1/3Nb2/3)O3-xPbTiO3 (PMN-xPT) single crystals (x = 0.28, 0.29, and 0.30) grown using the modified Bridgman method was investigated. After annealing and repoling, the free dielectric constant of 7600 and the dielectric loss lower than 2.1% were obtained for 0.05 mm thick PMN-0.30PT, which are superior to previously reported properties for similar thicknesses. Although the free dielectric constant of PMN-0.28PT and PMN-0.29PT decreased by up to 10% as the sample thickness decreased from 0.30 to 0.05 mm, it improved after annealing and repoling, and remained stable at each thickness. From sample surface evaluations, a mechanically damaged layer was observed near the ground surface. This layer influences the crystal strain direction and crystal phases, suggesting that it influences the degradation properties.
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