Abstract
Atomic force microscopy (AFM) is used to probe the local piezoelectric properties of CaBi4Ti4O15 (CBT) bismuth-layer-structured ferroelectric thin films. Calibration with Z-cut LaTiO3 and X-cut quartz crystals shows that a conductive AFM tip can be employed as a top electrode to accurately evaluate the piezoelectric displacement in ferroelectric materials without a top electrode. Our measurements on individual grains in CBT film clearly reveal that the local piezoelectric properties are determined by the polarization state in the grain. In a grain with a polar axis very close to the normal direction, a piezoelectric coefficient of 16 pm/V was attained after poling.
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