Attaching Silica Nanoparticles from Suspension onto Surface Charge Patterns Generated by a Conductive Atomic Force Microscope Tip

Abstract

A conductive atomic force microscope (AFM) tip acts as a nanopencilto write positive or negative charge patterns into a fluorocarbon film. Silica nanobeads (with a positive surface charge) can be attached to negative patterns by Coulombic interaction. While the resolution of the writing process is up to 100 nm, coagulation of the silica beads makes 1 μm a realistic minimum width for structures thus formed (see Figure and also cover).