Abstract
A review is provided on state-of-the-art techniques for the physics-based numerical simulation of noise in semiconductor devices, with particular attention to large-signal forced operation and to the related noise frequency conversion. Open problems associated to the modeling of 1/f-like noise in large-signal operation through a superposition of GR noise sources are discussed with the help of simulation examples. Finally, a 2D physics-based noise analysis of a FET active mixer is presented
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