Abstract
The motivations for using computers to simulate the electrical characteristics of transistors are discussed. Our work and that of others in the area of device physics and modeling are described. We compare conventional device physics with an alternative approach to device physics that is more directly traceable to quantum-mechanical concepts. We then apply this new approach to quasi-neutral regions, space-charge regions, and regions with high levels of carrier injection. Examples of applying quantum-mechanically-based device physics to energy band diagrams for bipolar transistors are given. The limits for using theoretical results from uniform media in numerical simulations of devices with large concentration gradients are discussed. Calculations of the effective intrinsic carrier concentrations for gallium arsenide and silicon are also given along with published data. In addition, calculations of the mobilities for GaAs that are based in part on quantum-mechanical phase shifts are compared with published data. We then conclude with a discussion of the requirements for verifying and calibrating device simulators for the submicrometer domain.
Sign-in/Register to access full text options 
Talk to us
Join us for a 30 min session where you can share your feedback and ask us any queries you have
Schedule a callDisclaimer: All third-party content on this website/platform is and will remain the property of their respective owners and is provided on "as is" basis without any warranties, express or implied. Use of third-party content does not indicate any affiliation, sponsorship with or endorsement by them. Any references to third-party content is to identify the corresponding services and shall be considered fair use under The CopyrightLaw.
