Abstract
A generalized 2-D analytical model of gate threshold voltage for multiple material gate Tunneling FET (TFET) structures is derived. The model can also be used for calculating threshold voltage of a single metal gate TFET. Surface potential model of a triple material double gate TFET has been developed by applying Gauss's law in the device. From the potential model, physics-based model of gate threshold voltage has been derived by exploring the transition between linear to quasi-exponential dependence of drain current on applied gate bias. The model includes the effect of gate and drain bias, gate material workfunction, oxide thickness, silicon film thickness, gate dielectric, and other device parameters. The accuracy of the proposed model is verified by comparing the results predicted by the proposed model to the results of the numerical model developed in Silvaco, Atlas.
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