Abstract
We present an experimental study on the photosensitive properties of narrow bandpass filters based on a chalcogenide Te 20As 30Se 50 (TAS) spacer. The transmittance curve of single TAS layer was shifted towards long wavelength direction after 2 h exposure by Xenon arc lamp. The refractive index and extinction coefficient were both increased together with a red shift of optical gap. A maximum 1.7% photo-induced effect was observed. Narrow band filters constituted by TAS and cryolite were manufactured by electron beam deposition. The transmittance spectrum of the filter during the exposure by a wide band source was in situ measured and the resonant wavelength was observed to turn longer gradually till saturation. A spatially localized central wavelength change up to 5.7 nm was finally obtained. The stability of the photo-induced effect was studied and some comments were given at the end of this paper.
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