Abstract
Photorefractive grating formation and erasure in piezoelectric crystals of La3Ga5SiO14:Pr3+ are presented. The specific photoconductivity and the photorefractive sensitivity are determined. The polarization dependence of the grating formation due to the bulk photovoltaic effect is shown and compared favorably with the theoretical expression. This photorefractive material provides a possibility for separate investigations of the charge migration processes responsible for the photorefractive effect.
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