Abstract
Original results on investigation of the photorefractive effect in straight channels and integrated-optical circuits such as a directional coupler, Y-splitter and Mach–Zehnder interferometer, exploiting titanium-indiffused and proton-exchanged LiNbO3 waveguides, are presented. It has been found that the photorefractive damage is non-negligible for IR radiation with wavelengths near 1.5 μm in all circuits studied. The new methods for accurate evaluation of small extents of photorefractive effect are proposed.
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