Abstract
Photon stimulated ion desorption (PSID) of thin films of selectively deuterated polystyrene ([ CD 2 CD(C 6H 5) ] n,[ CH 2 CH(C 6D 5) ] n and[ CD 2 CD(C 6D 5) ] n) have been investigated to reveal the mechanism of surface photochemical reactions following core excitation. Desorbing ions were measured using the time-of-flight mass spectrometer (TOF-MS) combined with a pulsed synchrotron radiation. From the total electron yield spectrum and partial ion yield spectrum of each sample, it is concluded that D + ions are mainly desorbed from the phenyl group and the yield of D + is enhanced at the C D * resonance. From the ion kinetic energy distribution obtained from analysis of the TOF spectrum, the ions desorbed from the phenyl group have different kinetic energy distribution. The results are discussed in connection with the mechanism of PSID.
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