Abstract

Low temperature photoluminescence (PL) of high-resistivity detector-grade Cl-compensated CdTe semiconductor crystals subjected to irradiation with nanosecond (τ = 7 ns) laser pulses of the second harmonic (λ = 532 nm) of a YAG:Nd laser is studied. Irradiation of CdTe crystals within the certain range of laser pulse energy densities results in a relative decrease in the emission intensity in both the deep energy level and edge regions and an increase in the exciton band intensity in the PL spectra. The evolution of the PL spectra depending on laser energy density, excitation level and temperature under excitation are analyzed. Laser-stimulated transformation of the point defect structure of the CdTe surface region and mechanisms of laser-induced defect formation are discussed. The optimal regimes of laser processing have been obtained which result in the minimum ratio of the defect and exciton bands that is an evidence of an increase in the structural perfection of the irradiated crystals.

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