Abstract
ZnGa2O4 thin-film phosphors have been grown on Si(100), Al2O3(0001) and MgO(100) substrates using pulsed laser deposition. The structural characterization was carried out on a series of ZnGa2O4 films grown on various substrates under various substrate temperatures and oxygen pressures. The films grown on these substrates not only have different crystallinity and surface morphology, but also different Zn/Ga composition ratio. The crystallinity and photoluminescence (PL) of the ZnGa2O4 films are highly dependent on the deposition conditions, in particular the stoichiometry ratio of Zn/Ga and the kind of substrate. The variation of Zn/Ga in the films also depends on not only the oxygen pressure but also the substrate temperature during deposition. The PL properties of pulsed laser deposited ZnGa2O4 thin films have indicated that Al2O3(0001) and MgO(100) are promising substrates for the growth of high-quality ZnGa2O4 thin films and that the luminescence brightness depends on the substrate. The luminescence spectra show a broad band extending from 350 to 600 nm and peaking at 460 nm.
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