Abstract
The recent progress made in understanding the multiplet structure, lineshape and intensities in 4f-photoemission is briefly reviewed. The application of high-resolution X-ray and ultraviolet photoemission spectroscopy (XPS and UPS resp.) to the study of configurationally mixed electron states near the Fermi energy in metallic systems is discussed. Effects of configurational mixing on core levels is described, as seen by XPS and X-ray emission spectroscopy. Sm and Ce metal will be considered in this special case. An example of a detailed analysis of 4f-photoemis-sion lineshapes in substituted Sml-xRxS alloys, R = Ca, Y and Th is presented and shown to provide new information on the role of electronic effects in the valence transition of Sm. The use of electron energy loss spectroscopy (ELS) to study intraionic f → d and charge transfer transitions will also be discussed. These results are compared with XPS and UPS data with the aim of demonstrating the possibilities of these techniques to cast new light on the electronic structure of metallic mixed-valent materials.
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