Abstract
Photoemission microscopy is a high-contrast method that is now being rediscovered by surface scientists because of its versatility and surface selectivity. Microscopes using photoelectrons emitted from the specimen surface are termed photoemission, or photoelectron microscopes and may also be subdivided into scanning and direct imaging microscopes, categorized into classes depending on the excitation energy, and further distinguished by the electron-optical methods or systems used to form an image. The photoelectron emission microscope (PEEM) is based on the cathode lens, as are other types of emission microscopes. Image contrast in PEEM can have various origins and can be challenging to interpret. The depth of information in PEEM is determined by the escape depth of the photoelectrons. Illumination intensity is a major limitation of the PEEM technique. Synchrotron radiation is attractive for PEEM illumination because of the high intensity available, and because the photon energy of the illumination is continuously variable over the range from about 5 eV to several keV.
Published Version
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