Photoelectrical characterization of a new low molecular weight compound

Abstract

Photoelectrical characterization of a newly synthesized low molecular weight compound was carried out. 1,8-naphtalimide (chemical formula C32H34N4O5S) was originally synthesized and analyzed by NMR spectroscopy. Thin films were deposited in vacuum on commercially pre-patterned ITO covered glass substrates and the samples were prepared in clean room environment. The films deposited were characterized by SEM. Photoelectrical characteristics of the samples prepared were estimated by dark current-voltage measurement, spectral dependence of the photoconductivity and measurement under exposure with light, produced by solar simulator. Finally electroluminescence measurements were performed. It was found that the samples exhibit diode behaviour. The low values characterizing photovoltaic parameters obtained could be connected with the relative higher series resistance (Rseries). The predominant influence of Rseries is assumed as the relative high photoluminescence, measured from solution should be related to a relatively strong charge carrier photogeneration. This result is supported by electroluminescent measurement. Another reason for the low values of the photovoltaic parameters measured could be the non-optimized film thickness leading to a non-optimal light absorption and increased charge carrier recombination. The assumption for the predominant influence of Rseries is supported by the electroluminescent measurements.