Abstract
This paper describes a new technique that uses a 1064nm wavelength laser for failure analysis of CMOS integrated circuits. We propose a new flow to deal with Latch-Up (LU) phenomenon issues and for this we have developed a new technique that allows localizing areas sources of Latch-Up triggering in an Integrated Circuit (IC). An effectiveness of this method is verified by an experiment on a microcontroller and has proved to be useful for finding the sensitive location. The proposed methodology further extends the capabilities of Photoelectric Laser Stimulation (PLS) in qualification and characterization domains.
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