Abstract
The photochemistry of trimethylindium (TMI) adsorbed on a quartz substrate at 150 K has been studied by time of flight mass spectrometry (TOF/MS) using electron impact ionization and resonance-enhanced multiphoton ionization techniques. Photolysis of adsorbed TM1 at 222 nm results in the deposition of indium metal on the surface and the ejection of neutral and ionic fragments into the gas phase. The gas-phase photofragments observed were the neutral products In(CH 3 ) 2 , InCH 3 , In, and CH 3 and the ions In + , CH 3 + , and In(CH 3 ) +
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