Abstract

We report a GaN based metal–semiconductor–metal (MSM) infrared photodetector enabled with azimuthally distributed sub-wavelength gratings fabricated on one of the working electrodes. Under illumination, hot electron transfer is introduced by the plasmonic resonance in the infrared waveband formed at the interface of Au/GaN. Without the help of using any external optical polarizers, the device is able to detect radial polarization vortices in the form of photocurrents with a prescribed response spectrum. The detector exhibits a 10%–90% rise and fall time of 0.9 ms under modulated light, much faster than that of conventional ultraviolet GaN MSM photodetectors based on the band edge absorption. This work provides a viable way to measure spatially variant polarization beams with a compact plasmonic photodetectors fabricated from wide bandgap semiconductors.

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