Abstract
Silicon nanowire (NW) field-effect transistor (FET) sensors of various lengths were fabricated. Transport properties of Si NW FET sensors were investigated involving noise spectroscopy and current–voltage (I–V) characterization. The static I–V dependencies demonstrate the high quality of fabricated silicon FETs without leakage current. Transport and noise properties of NW FET structures were investigated under different light illumination conditions, as well as in sensor configuration in an aqueous solution with different pH values. Furthermore, we studied channel length effects on the photoconductivity, noise, and pH sensitivity. The magnitude of the channel current is approximately inversely proportional to the length of the current channel, and the pH sensitivity increases with the increase of channel length approaching the Nernst limit value of 59.5 mV/pH. We demonstrate that dominant 1/f-noise can be screened by the generation-recombination plateau at certain pH of the solution or external optical excitation. The characteristic frequency of the generation-recombination noise component decreases with increasing of illumination power. Moreover, it is shown that the measured value of the slope of 1/f-noise spectral density dependence on the current channel length is 2.7 which is close to the theoretically predicted value of 3.
Highlights
For devices operating at weak signal levels, internal noise plays crucial role [4, 19–21]. It determines one of the most important parameters of sensors—signal-to-noise ratio (SNR). As it is shown for double-gated SiNW sensors, pH sensitivity increases with the liquid gate voltage and SNR has higher value (~ 105) [11, 18]
Surface roughness and contribution of dielectric layers may considerably change structure properties depending on fabrication technology applied for different set of devices. In this respect, understanding channel length effects in the same set of NW field-effect transistors (FETs) are important for the development of devices with advanced functionality
The involving noise spectroscopy and current–voltage (I–V) dependencies demonstrate typical behavior which is similar to the metaloxide-semiconductor FETs (MOSFETs) [24] since the samples under investigation have relatively large dimensions of l × w × t = (2 ÷ 10) × 10 × 0.05 μm (l, w, and t are the channel length, width, and thickness, correspondingly)
Summary
Over the past decade, nanosized silicon structures have been under intensive study [1] due to their promising electrical, optical, chemical, thermal, and mechanical properties. Nanowires obtained by utilizing single- or few-atom-thick lamellar crystals are novel forms of one-dimensional nanoscale materials and are ideal systems for investigation of the size dependence of the fundamental properties. Surface roughness and contribution of dielectric layers may considerably change structure properties depending on fabrication technology applied for different set of devices. In this respect, understanding channel length effects in the same set of NW FETs are important for the development of devices with advanced functionality. The present work is devoted to the study of silicon nanowire-based FETs, including the sample fabrication technology, and chip characterization, their dark and light current–voltage (I–V) characteristics and pH sensitivity.
Sign-in/Register to view highlights & summary Sign-in/Register to access full text options 
Talk to us
Join us for a 30 min session where you can share your feedback and ask us any queries you have
Schedule a callDisclaimer: All third-party content on this website/platform is and will remain the property of their respective owners and is provided on "as is" basis without any warranties, express or implied. Use of third-party content does not indicate any affiliation, sponsorship with or endorsement by them. Any references to third-party content is to identify the corresponding services and shall be considered fair use under The CopyrightLaw.
