Abstract
AbstractAs a metal‐free semiconductor, carbon nitride is a promising material for sustainable photocatalysis. From the large number of studies, it seems apparent that the photocatalytic activity is related to the number and type of defects present in the structure. Many defects are paramagnetic and photoresponsive and, for these reasons, Electron Paramagnetic Resonance (EPR) spectroscopy is a powerful method to derive fundamental information on the structure – local, extended and electronic – of such defects which in turn impact the optical, magnetic and chemical properties of a material. This review aims at critically discussing the interpretation of EPR data of native and photoinduced radical defects in carbon nitride research highlighting strengths and limitations of this spectroscopic technique.
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